Latchup Tester

Latchup is a term used in the realm of integrated to describe a particular type of supply voltage short circuit caused by the triggering of a parasitic structure. The parasitic structure is usually equivalent to a thyristor. Devices that are unprotected against Latchup can be destroyed by the high currents and the related thermal stress.

The effect is triggered by a short spike in the voltage supply (i.e. Overvoltage or electrostatic discharge) or by incorrect power up sequencing of the voltage supplies.

The Latchup test system is able to perform tests according to the Jedec 78A (IC Latch-Up Test) standard.

Facts

Run tests with up to 200 test structures
Set up tests with a user friendly grafical user interface
adapting to individual requirements is possible
modular design made up of standard components from Keithley Instruments

Service

Do you have questions or would like to be called back by one of our engineers?

Latchup Tester

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