Electromigration test system

Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits decreases, the practical significance of this effect increases. (Source: Wikipedia/Electromigration)

The electromigration test system allpies a controlled stress to a number of devices under test in order to trigger and accellerate the process of electromigration. This kind of measurements helps gathering the data necessary for estimating the life expectancy of integrated circuits (ICs).

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